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[IRE 1977 International Electron Devices Meeting - ()] 1977 International Electron Devices Meeting - Numerical analysis of gate triggered SCR turn-on transients

โœ Scribed by Anheier, W.; Engl, W.L.; Sittig, R.


Book ID
126625905
Publisher
IRE
Year
1977
Weight
217 KB
Category
Article

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