<p><p><b><i>Helium Ion Microscopy: Principles and Applications</i></b> describes the theory and discusses the practical details of why scanning microscopes using beams of light ions โ such as the Helium Ion Microscope (HIM) โ are destined to become the imaging tools of choice for the 21st century. T
Ion Tracks and Microtechnology: Principles and Applications
โ Scribed by Dr. Reimar Spohr (auth.), Prof. Dr. Klaus Bethge (eds.)
- Publisher
- Vieweg+Teubner Verlag
- Year
- 1990
- Tongue
- English
- Leaves
- 282
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Table of Contents
Front Matter....Pages I-X
Introduction....Pages 1-13
Irradiation technology....Pages 14-48
Energy-loss phenomena....Pages 49-92
Formation of the latent track....Pages 93-125
Development of ion tracks....Pages 126-154
Observation of ion tracks....Pages 155-166
Resulting structures....Pages 167-182
Single-ion tracks....Pages 183-210
Multiple ion tracks....Pages 211-229
Bulk properties....Pages 230-245
Growth areas....Pages 246-261
Concluding remarks....Pages 262-262
Back Matter....Pages 263-274
โฆ Subjects
Engineering, general
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