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Ion-sensitive field-effect transistors in standard CMOS fabricated by post processing

✍ Scribed by Jakobson, C.G.; Dinnar, U.; Feinsod, M.; Nemirovsky, Y.

Book ID: 120036672
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 544 KB
Volume: 2
Category: Article
ISSN: 1530-437X
DOI: 10.1109/JSEN.2002.802237

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