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Ion microprobe for studying cluster ion decay reactions

โœ Scribed by A. D. Bekkerman; N. Kh. Dzhemilev; V. M. Rotstein


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
360 KB
Volume
15
Category
Article
ISSN
0142-2421

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โœฆ Synopsis


Abstract

In the present paper, an ion microprobe is used to study the fragmentation regularities of Al~n~^+^ and Si~n~^+^ cluster ions sputtered under ion bombardment. The results have shown that the ions formed during cluster fragmentation, along the path from the target to the detector, transform the mass spectra of both charged and neutral components and the energy distribution of the parent cluster and monomer ions.


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