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Ion induced composition changes on (110) InP cleaved surface

✍ Scribed by Morais, J. ;Fazan, T. A. ;Landers, R.


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
182 KB
Volume
141
Category
Article
ISSN
0031-8965

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## Abstract The previously reported^1,2^ effect of low‐energy (several keV) ion bombardment on the surface topography of InP was investigated by scanning transmission electron microscopy. Convergent beam electron diffraction patterns of the surface growth β€˜cones’ induced by argon ion bombardment of