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Ion beam sputtered Ge–Si–O amorphous thin films for microbolometer infrared detectors and their application in earth sensors

✍ Scribed by Sumesh, M.A.; Karanth, Shivaprasada; Prakash, Sharadadevi; Laxmiprasad, A.S.; Nagendra, C.L.


Book ID
118167417
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
430 KB
Volume
192
Category
Article
ISSN
0924-4247

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