Ion-beam induced defect formation in α-alumina with applied electric field

✍ Scribed by T. Higuchi; K. Yasuda; K. Tanaka; K. Shiiyama; C. Kinoshita

• Book ID: 114167026
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 301 KB
• Volume: 206
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(03)00693-1