✦ LIBER ✦
Ion beam induced charge collection (IBICC) microscopy of ICs: relation to single event upsets (SEU)
✍ Scribed by K.M. Horn; B.L. Doyle; F.W. Sexton; J.S. Laird; A. Saint; M. Cholewa; G.J.F. Legge
- Book ID
- 113284174
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 988 KB
- Volume
- 77
- Category
- Article
- ISSN
- 0168-583X
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