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Investigations to calibrate reference standards for the thickness of coatings

โœ Scribed by T. Ahbe; K. Hasche; K. Herrmann; K.-P. Hoffmann; K. Thiele

Book ID
105897777
Publisher
Springer
Year
1999
Tongue
English
Weight
239 KB
Volume
365
Category
Article
ISSN
1618-2650

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There are important technological and scientific needs for accurate and precise measurements of the weight and thickness of silicone coatings, which are used in wide-ranging applications. X-ray fluorescence (XRF) spectroscopy offers one means of achieving such measurements. Here we show that, as pre