Investigations on the use of chemical modifiers for the direct determination of trace impurities in Al2O3 ceramic powders by slurry electrothermal evaporation coupled with inductively-coupled plasma mass spectrometry (ETV–ICP–MS)

✍ Scribed by M. C. Wende; J. A. C. Broekaert

• Publisher: Springer
• Year: 2001
• Tongue: English
• Weight: 284 KB
• Volume: 370
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/s002160100783