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Investigations on Nanoscale Multilayers by Analytical TEM in Scanning Mode

✍ Scribed by J. Thomas; H.-D. Bauer; S. Baunack; K. Wetzig

Book ID: 101381828
Publisher: John Wiley and Sons
Year: 2000
Tongue: English
Weight: 423 KB
Volume: 35
Category: Article
ISSN: 0232-1300
DOI: 10.1002/1521-4079(200007)35:6/7<839::aid-crat839>3.0.co;2-#

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