Investigations of trace analysis of AIIIBV semiconductor microsamples by atomic spectroscopy—VII: Investigation of trace and thin-layer analysis of doping elements (Ag, Au, Bi, Cd, Sn, Tl) in InAs by atomic-absorption with electrothermal evaporation

✍ Scribed by K. Dittrich; W. Mothes; I.G. Yudelevich; T.S. Papina

• Book ID: 118994377
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 687 KB
• Volume: 32
• Category: Article
• ISSN: 0039-9140
• DOI: 10.1016/0039-9140(85)80059-x