Investigations of thick YBCO coated conductor with high critical current using IBAD-PLD method

✍ Scribed by A. Ibi; H. Iwai; K. Takahashi; T. Muroga; S. Miyata; T. Watanabe; Y. Yamada; Y. Shiohara

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 171 KB
• Volume: 426-431
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2005.02.083

✦ Synopsis

Thick YBCO film were deposited by the PLD method on the self-epitaxial CeO 2 buffered substrate: a CeO 2 cap layer was deposited by the PLD method on Gd 2 Zr 2 O 7 buffered Hastelloy tape by the IBAD method and highly texturing up to 4°was obtained. We have investigated the Du, R a value, amount of existing a-axis oriented crystals, and I c of YBCO coated conductor with increasing YBCO thickness. To obtain YBCO coated conductors with high I c , good in-plane texturing of the CeO 2 layer is required. However, the value of I c saturated at a certain YBCO thickness, critical thickness, d c . As the YBCO thickness increased, the surface morphology became much rougher. Consequently, the surface temperature of YBCO becomes lower and the amount of a-axis oriented crystals in YBCO increased. Then, thick YBCO film exhibited d c . To solve this problem, we fabricated YBCO by multi-layer deposition using the Reel-to-Reel system, which was carried out at various temperatures. This process increases J c from 0.54 to 0.89 A/cm 2 .