✦ LIBER ✦
Investigations of the ionizing radiation induced effects in ultra-thin strained-silicon layers on insulator using confocal microscopy measurements
✍ Scribed by M. Gaillardin; S. Girard; Y. Ouerdane; A. Boukenter; F. Andrieu; C. Tabone; O. Faynot
- Book ID
- 116672698
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 723 KB
- Volume
- 357
- Category
- Article
- ISSN
- 0022-3093
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