Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing

✍ Scribed by Faraud, E.; Pouget, V.; Shao, K.; Larue, C.; Darracq, F.; Lewis, D.; Samaras, A.; Bezerra, F.; Lorfevre, E.; Ecoffet, R.

• Book ID: 120416307
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 731 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2011.2172222