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Investigation on the Initial Hot-Carrier Injection in P-LDMOS Transistors With Shallow Trench Isolation Structure

✍ Scribed by Ru-Yi Su; Chiang, P.Y.; Jeng Gong; Tsung Yi Huang; Chun-Lin Tsai; Chou, C.C.; Liu, C.M.


Book ID
114619247
Publisher
IEEE
Year
2008
Tongue
English
Weight
734 KB
Volume
55
Category
Article
ISSN
0018-9383

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