✦ LIBER ✦
Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology
✍ Scribed by Shih-Hung Chen; Ming-Dou Ker
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 849 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0026-2714
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