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Investigation on residual stress and stress-optical coefficient for flexible electronics by photoelasticity

✍ Scribed by Y.C. Lee; T.S. Liu; C.I. Wu; W.Y. Lin

Book ID: 113796824
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 973 KB
Volume: 45
Category: Article
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2011.11.017

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