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Investigation on defects in Lu2SiO5:Ce crystals grown by Czochralski method

✍ Scribed by Guohao Ren; Laishun Qin; Huanying Li; Sheng Lu

Publisher: John Wiley and Sons
Year: 2006
Tongue: English
Weight: 241 KB
Volume: 41
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.200510549

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