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Investigation of useful or deleterious residual thermal stress component to the capacitance of a multilayer ceramic capacitor

✍ Scribed by Hyunho Shin; Jong-Sung Park; Sujin Kim; Hyun Suk Jung; Kug Sun Hong


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
178 KB
Volume
77
Category
Article
ISSN
0167-9317

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