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Investigation of traps in the nSiCpSi interface at cryogenic temperatures

✍ Scribed by V.S. Lysenko; Y.V. Gomeniuk; I.N. Osiyuk; I.P. Tyagulski


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
223 KB
Volume
28
Category
Article
ISSN
0167-9317

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