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Investigation of Trap Spacing for the Amorphous State of Phase-Change Memory Devices

โœ Scribed by Jeyasingh, R.G.D.; Kuzum, D.; Wong, H.-S.P.


Book ID
114620751
Publisher
IEEE
Year
2011
Tongue
English
Weight
836 KB
Volume
58
Category
Article
ISSN
0018-9383

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