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Investigation of thick film technology for microwave applications : M. J. Stennes, K. D. Stephan, H. Campbell, C. P. Smith and R. M. Zilberstein. Microelectron. J.18(5), 29 (1987)


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
137 KB
Volume
29
Category
Article
ISSN
0026-2714

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