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Investigation of the Two-State Current Conduction Mechanism in High-k∕SiO2 Stacked Dielectric with High Bandgap 4H-SiC Substrate

✍ Scribed by Chiang, Jung-Chin; Hwu, Jenn-Gwo


Book ID
118173709
Publisher
The Electrochemical Society
Year
2011
Tongue
English
Weight
382 KB
Volume
158
Category
Article
ISSN
0013-4651

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