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Investigation of the threshold voltage of MOSFETs with position and potential-dependent interface trap distributions using a fixed-point iteration method

✍ Scribed by Gaitan, M.; Mayergoyz, I.D.; Korman, C.E.


Book ID
114536540
Publisher
IEEE
Year
1990
Tongue
English
Weight
815 KB
Volume
37
Category
Article
ISSN
0018-9383

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