Investigation of the thermal stability and crystallization process of amorphous Hf0.67T0.33−xMx alloys, with T = Co or Ni, M = P or Si, by DSC, DTA and X-ray diffraction techniques

✍ Scribed by Kjell Jansson; Mats Nygren

• Book ID: 108025507
• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 449 KB
• Volume: 133
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/0921-5093(91)90111-y