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Investigation of the Statistical Variability of Static Noise Margins of SRAM Cells Using the Statistical Impedance Field Method

โœ Scribed by El Sayed, K.; Wettstein, A.; Simeonov, S.D.; Lyumkis, E.; Polsky, B.


Book ID
114620951
Publisher
IEEE
Year
2012
Tongue
English
Weight
473 KB
Volume
59
Category
Article
ISSN
0018-9383

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