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Investigation of the reactive properties of diffused Si p-n junctions in the region of high injection levels and strong electric fields

✍ Scribed by G.B. Abdullayev; E.A. Jafarova; Z.A. Iskender-Zade; V.E. Chelnokov; Sh. Alikhanova; A.Z. Badalov; M.R. Akhundov


Publisher
Elsevier Science
Year
1968
Tongue
English
Weight
521 KB
Volume
11
Category
Article
ISSN
0038-1101

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