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Investigation of the porous structure of polyvinylchloride by standard contact porometry

โœ Scribed by V.G. Marinin; D.N. Bort; B.S. Zav'yalova; Yu.M. Vol'fkovich; Ye.I. Shkol'nikov; E.P. Rybkin


Book ID
118966695
Publisher
Elsevier Science
Year
1980
Weight
453 KB
Volume
22
Category
Article
ISSN
0032-3950

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X-ray absorption measurements at the K-edge of silicon have been done in transmission mode on three powdered samples of porous silicon (p-Si) with 50%, 65% and 80% porosity, prepared by decreasing the HF content in the anodic solution. The analysis of EXAFS reveals a crystal-like structure of p-Si a