Investigation of the offset charge noise in single electron tunneling devices

✍ Scribed by Wolf, H.; Ahlers, F.J.; Niemeyer, J.; Scherer, H.; Weimann, T.; Zorin, A.B.; Krupenin, V.A.; Lotkhov, S.V.; Presnov, D.E.

• Book ID: 114543604
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 81 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.571840