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Investigation of the magnetic field angle dependence of resistance, irreversibility field, upper critical field and critical current density in DC sputtered Bi-2223 thin film

✍ Scribed by G. Yildirim; M. Akdogan; S.P. Altintas; M. Erdem; C. Terzioglu; A. Varilci

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 612 KB
Volume: 406
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2011.02.041

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