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Investigation of the long- and medium-term drift of Zener diode-based voltage standards

✍ Scribed by Power, O.; Walsh, J.E.

Book ID: 118698680
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 272 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2004.840227

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