✦ LIBER ✦
Investigation of the interface trap density and series resistance of a high- k HfO 2 -based MOS capacitor: before and after 50 MeV Li 3+ ion irradiation
✍ Scribed by Singh, Vikram; Shashank, N.; Kumar, Dinesh; Nahar, Rajender
- Book ID
- 121243100
- Publisher
- Taylor and Francis Group
- Year
- 2011
- Tongue
- English
- Weight
- 474 KB
- Volume
- 166
- Category
- Article
- ISSN
- 1042-0150
No coin nor oath required. For personal study only.