Investigation of the Failure Mechanism for an S-Band Pillbox Output Window Applied in High-Average-Power Klystrons

✍ Scribed by Fang Zhu; Zhao-Chuan Zhang; Ji-Run Luo; Yu-Wen Zhang

• Book ID: 114619938
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 481 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2041874