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Investigation of the entrainment of silicon atoms by “vacancies” formed in an aluminum melt when its surface is exposed to an ion-electron flux

✍ Scribed by V. A. Kolpakov; A. I. Kolpakov


Book ID
110124057
Publisher
SP MAIK Nauka/Interperiodica
Year
1999
Tongue
English
Weight
395 KB
Volume
25
Category
Article
ISSN
1063-7850

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