Investigation of the e0-electron yield from the surface of thin films under bombardment by α and β particles from radioactive sources

✍ Scribed by A. I. Feoktistov; A. A. Val’chuk; V. T. Kupryashkin; L. P. Sidorenko; I. P. Shapovalova

• Book ID: 107561737
• Publisher: Allerton Press Inc
• Year: 2008
• Tongue: English
• Weight: 169 KB
• Volume: 72
• Category: Article
• ISSN: 1062-8738
• DOI: 10.1007/s11954-008-2032-1