✦ LIBER ✦
Investigation of the Device Degradation Mechanism in Pentacene-Based Thin-Film Transistors Using Low-Frequency-Noise Spectroscopy
✍ Scribed by Lin Ke; Bin Dolmanan, S.; Vijila, C.; Soo Jin Chua; Ye Hua Han; Ting Mei
- Book ID
- 114619875
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 369 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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