✦ LIBER ✦
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
✍ Scribed by S. Ghosh; B. Grandchamp; G.A. Koné; F. Marc; C. Maneux; T. Zimmer; V. Nodjiadjim; M. Riet; J.-Y. Dupuy; J. Godin
- Book ID
- 113800561
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 678 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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