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Investigation of the CVD diamond-intermediate layer-steel interface

✍ Scribed by Nesladek, M.; Asinari, C.; Spinnewyn, J.; Lebout, R.; Lorent, R.; D'Olieslaeger, M.


Book ID
122953552
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
946 KB
Volume
3
Category
Article
ISSN
0925-9635

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A new method for measurin.g the interface properties, using diamond terminated silicon p-n diodes, is used to quantify the electrical quality and to determine the conduction mechanism of the silicon/diamond interface for two types of diamond. It was found that a high concentration of surface states