✦ LIBER ✦
Investigation of stability of GaAs metal/electron/semiconductor field effect transistor gate contacts by high resolution transmission electron microscopy analysis
✍ Scribed by N. Labat; Y. Danto; B. Plano; M. Chambon; J.-M. Dumas
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 562 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0921-5107
No coin nor oath required. For personal study only.