Investigation of sputter-deposited Al–2at.%Cu layers by means of the tomographic atom probe (TAP)

✍ Scribed by Pyuck-Pa Choi; Talaat Al-Kassab; Reiner Kirchheim

• Book ID: 113895515
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 301 KB
• Volume: 53
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/j.scriptamat.2005.04.008