✦ LIBER ✦
Investigation of soft upsets in integrated circuit memories and charge collection in semiconductor test structures by the use of an ion microbeam
✍ Scribed by A.R. Knudson; A.B. Campbell
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 545 KB
- Volume
- 218
- Category
- Article
- ISSN
- 0167-5087
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