✦ LIBER ✦
Investigation of Si/SiGe/Si on Si-on-insulator by high resolution electron microscopy and synchrotron radiation double-crystal topography
✍ Scribed by T.D. Ma; H.L. Tu; B.L. Shao; A.S. Liu; G.Y. Hu
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 397 KB
- Volume
- 124-125
- Category
- Article
- ISSN
- 0921-5107
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