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Investigation of SiO2 layers by glow discharge optical emission spectroscopy including layer thickness determination by an optical interference effect

✍ Scribed by Dorka, Roland; Kunze, Reinhard; Hoffmann, Volker


Book ID
120454208
Publisher
Royal Society of Chemistry
Year
2000
Tongue
English
Weight
118 KB
Volume
15
Category
Article
ISSN
0267-9477

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