✦ LIBER ✦
Investigation of Short-Circuit Failure Limited by Dynamic-Avalanche Capability in 600-V Punchthrough IGBTs
✍ Scribed by Oh, K.-H.; Kim, Y.C.; Lee, K.Y.; Yun, C.M.
- Book ID
- 120654098
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 510 KB
- Volume
- 6
- Category
- Article
- ISSN
- 1530-4388
No coin nor oath required. For personal study only.