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Investigation of resistance change characteristics with applied electric field on Ag/chalcogenide As2S3 and As40Ge10Se15S35 thin film structure

✍ Scribed by Yong-Woon Koo; Jin-Hong Kim; Won-Ju Cho; Hong-Bay Chung


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
236 KB
Volume
84
Category
Article
ISSN
0167-9317

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