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Investigation of Real-Time Microstructure Evolution in Steep Thermal Gradients Using in-Situ Spatially Resolved X-ray Diffraction: A Case Study for Ti Fusion Welds

✍ Scribed by Ressler, Thorsten; Wong, Joe; Elmer, John W.


Book ID
126273419
Publisher
American Chemical Society
Year
1998
Tongue
English
Weight
288 KB
Volume
102
Category
Article
ISSN
0022-3654

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