✦ LIBER ✦
Investigation of radiation-induced defects in silicon p-n junctions: M. G. Buehier. Rep-03-72-106 AFCRL-72-0578. Texas Instruments Inc., Dallas U.S.A. 70 pp. September (1973)
- Book ID
- 103273530
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 107 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.