Investigation of Proximity Effects in a 6T SRAM Cell Using Three-Dimensional TCAD Simulations

✍ Scribed by Simeonov, S.D.; Avci, I.; Balasingam, P.; Johnson, M.D.; Kucherov, A.; Lyumkis, E.; von Matt, U.; El Sayed, K.; Saha, A.R.; Tan, Z.; Tian, S.; Villablanca, L.; Polsky, B.

• Book ID: 114620397
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 469 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2109003