✦ LIBER ✦
Investigation of profiles of implanted Ti atoms over the depth of boron nitride nanocrystalline ceramic exposed to high radiation doses and fluxes with subsequent annealing
✍ Scribed by S. M. Duvanov; V. A. Baturin
- Book ID
- 110124056
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 1999
- Tongue
- English
- Weight
- 33 KB
- Volume
- 25
- Category
- Article
- ISSN
- 1063-7850
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